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Dislocation-disclination models of grain boundary migration in ultrathin nanocrystalline films

โœ Scribed by M. Yu. Gutkin; N. K. Dynkin


Book ID
114992533
Publisher
SP MAIK Nauka/Interperiodica
Year
2012
Tongue
English
Weight
325 KB
Volume
54
Category
Article
ISSN
1063-7834

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Low-angle grain boundary migration in th
โœ A.T. Lim; D.J. Srolovitz; M. Haataja ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 440 KB

We investigated the migration of a symmetric tilt, low-angle grain boundary (LAGB) under applied shear stress in the presence of extrinsic dislocations. The results demonstrate that there is a threshold stress for the LAGB to depin from extrinsic dislocations. Below the threshold stress, the LAGB re