๐”– Bobbio Scriptorium
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Dislocation Behavior in Pure Niobium at Low Temperatures

โœ Scribed by Ikeno, S. ;Furubayashi, E.

Publisher
John Wiley and Sons
Year
1975
Tongue
English
Weight
609 KB
Volume
27
Category
Article
ISSN
0031-8965

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๐Ÿ“œ SIMILAR VOLUMES

Creep of niobium at low temperatures
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โœ G.A Stone; H Conrad ๐Ÿ“‚ Article ๐Ÿ“… 1964 ๐Ÿ› Elsevier Science โš– 534 KB

The activation energy, H, the activation volume, w\*, and the frequency factor, Y, for the plastic deformation of niobium at low temperatures (T < 0.2 T,) were derived from creep tests. The values of H and e\* for r\* = 1 kg/mm2 were 0.75 eV and 47bS respectively, decreasing with increase in stress.

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Dedicated to Professor V. I. STARTSEV on the occasion of his 70th birthday The mobility of dislocations in LiF has been measured a t 4.2 and 10 K by means of an etch pit technique. The average velocity of screw dislocations is 2-5 times as large as edge dislocations. The results of the stress and t