Discussion on Physical Models for Burst Noise in a Forward Biased P–N Junction and Their Experimental Validation

✍ Scribed by Yisong Dai; Yaqin Li; Jiansheng Xu

• Book ID: 108362260
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 175 KB
• Volume: 38
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(97)00232-1