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Discrete current fluctuations in InP MIS structures due to defects created by breakdown degradation in InP native oxide

✍ Scribed by D. Pogany; S. Ababou; G. Guillot; P. Louis


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
325 KB
Volume
22
Category
Article
ISSN
0167-9317

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