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Directed 2D-to-3D Pattern Transfer Method for Controlled Fabrication of Topologically Complex 3D Features in Silicon

✍ Scribed by Konrad Rykaczewski; Owen J. Hildreth; Ching P. Wong; Andrei G. Fedorov; John Henry J. Scott


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
454 KB
Volume
23
Category
Article
ISSN
0935-9648

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