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Direct transfer patterning on three dimensionally deformed surfaces at micrometer resolutions and its application to hemispherical focal plane detector arrays

✍ Scribed by Xin Xu; Marcelo Davanco; Xiangfei Qi; Stephen R. Forrest


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
406 KB
Volume
9
Category
Article
ISSN
1566-1199

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