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Direct sub-100-nm patterning of an organic low-k dielectric for electrical and optical interconnects

✍ Scribed by Jeffrey M. Catchmark; Guy P. Lavallee; Michael Rogosky; Youngchul Lee


Book ID
107453477
Publisher
Springer US
Year
2005
Tongue
English
Weight
92 KB
Volume
34
Category
Article
ISSN
0361-5235

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