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Direct sampling time-of-flight mass spectrometers for technological analysis

✍ Scribed by Alexander A. Sysoev; Alexey A. Sysoev; S. S. Poteshin; V. I. Pyatakhin; I. V. Shchekina; A. S. Trofimov

Publisher: Springer
Year: 1998
Tongue: English
Weight: 141 KB
Volume: 361
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s002160050876

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