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Direct Probing of Electrical Double Layers by Scanning Electrochemical Potential Microscopy

✍ Scribed by Hurth, C.; Li, C.; Bard, A.J.

Book ID: 125528637
Publisher: American Chemical Society
Year: 2007
Tongue: English
Weight: 478 KB
Volume: 111
Category: Article
ISSN: 1932-7447
DOI: 10.1021/jp0661084

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