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Direct observation of Si lattice strain and its distribution in the Si(001)–SiO[sub 2] interface transition layer

✍ Scribed by Kim, Young Pil; Choi, Si Kyung; Kim, Hyun Kyong; Moon, Dae Won


Book ID
120479278
Publisher
American Institute of Physics
Year
1997
Tongue
English
Weight
279 KB
Volume
71
Category
Article
ISSN
0003-6951

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