Direct observation of lamellar 90° and 180° domains in single grains of PZT thin film at nanoscale resolution
✍ Scribed by H. F. Yu; H. R. Zeng; R. Q. Chu; G. R. Li; Q. R. Yin
- Book ID
- 105362887
- Publisher
- John Wiley and Sons
- Year
- 2004
- Tongue
- English
- Weight
- 289 KB
- Volume
- 202
- Category
- Article
- ISSN
- 0031-8965
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✦ Synopsis
Abstract
A ferroelectric PZT thin film with (111) orientation was prepared by a sol–gel process and deposited by spin coating on a Pt(111)/Ti/SiO~2~/Si wafer. The three‐dimensional (in‐plane and out‐of‐plane) domain structures were in situ visualized by using scanning force microscopy in piezoresponse mode at nanoscale resolution. Both lamellar 90° and 180° domain patterns with almost equal widths of 20–30 nm were extensively observed inside single grains. The domain distribution is a result of local mechanical stress at the interface between the grain and the substrate from periodic lattice‐constant mismatch. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)