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Direct Observation of Anomalous Positive Charge and Electron-Trapping Dynamics in High-k Films Using Pulsed-MOS-Capacitor Measurements

✍ Scribed by Stephen Hall; Octavian Buiu; Yi Lu


Book ID
114618580
Publisher
IEEE
Year
2007
Tongue
English
Weight
246 KB
Volume
54
Category
Article
ISSN
0018-9383

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