✦ LIBER ✦
Direct micro-imaging of point defects in bulk SiO 2 , applied to vacancy diffusion and clustering
✍ Scribed by Suhovoy, E.; Mishra, V.; Shklyar, M.; Shtirberg, L.; Blank, A.
- Book ID
- 119999665
- Publisher
- EDP Sciences
- Year
- 2010
- Tongue
- English
- Weight
- 530 KB
- Volume
- 90
- Category
- Article
- ISSN
- 0295-5075
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