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Direct measurement of the electron-phonon relaxation rate in thin copper films

✍ Scribed by L. J. Taskinen; J. M. Kivioja; J. T. Karvonen; I. J. Maasilta

Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 214 KB
Volume: 1
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.200405307

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