Direct measurement of facet temperature up to melting point and COD in high-power 980-nm semiconductor diode lasers

✍ Scribed by Sweeney, S.J.; Lyons, L.J.; Adams, A.R.; Lock, D.A.

• Book ID: 114569749
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 413 KB
• Volume: 9
• Category: Article
• ISSN: 1077-260X
• DOI: 10.1109/jstqe.2003.820912