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Direct Measurement of Auger Electrons Emitted from a Semiconductor Light-Emitting Diode under Electrical Injection: Identification of the Dominant Mechanism for Efficiency Droop

✍ Scribed by Iveland, Justin; Martinelli, Lucio; Peretti, Jacques; Speck, James S.; Weisbuch, Claude


Book ID
120400082
Publisher
The American Physical Society
Year
2013
Tongue
English
Weight
399 KB
Volume
110
Category
Article
ISSN
0031-9007

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