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Direct investigation of very thin CdSe layers on ZnSe by out-of-plane grazing incidence X-ray diffraction

✍ Scribed by G. Alexe; T. Passow; T. Schmidt; J. Falta; H. Heinke; D. Hommel

Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 198 KB
Volume: 1
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.200304297

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