✦ LIBER ✦
Direct indication of lateral nonuniformities of MOS capacitors from the negative equivalent interface trap density based on charge-temperature technique
✍ Scribed by J. G. Hwu; W. S. Wang
- Book ID
- 104841834
- Publisher
- Springer
- Year
- 1986
- Tongue
- English
- Weight
- 497 KB
- Volume
- 40
- Category
- Article
- ISSN
- 1432-0630
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