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Direct imaging of transient interference in a single-mode waveguide using near-field scanning optical microscopy

✍ Scribed by Guang Wei Yuan; Stephens, M.D.; Dandy, D.S.; Lear, K.L.

Book ID: 119802382
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 354 KB
Volume: 17
Category: Article
ISSN: 1041-1135
DOI: 10.1109/lpt.2005.858151

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