Direct determination of trace silicon in lanthanum oxide by using a selective volatility and slurry sampling-FETV-ICP-AES

✍ Scribed by Qin Yongchao; Peng Tianyou; Jiang Zucheng; Zeng Yun'e

• Publisher: Wuhan University
• Year: 1997
• Tongue: English
• Weight: 293 KB
• Volume: 2
• Category: Article
• ISSN: 1007-1202
• DOI: 10.1007/bf02834923