✦ LIBER ✦

Direct determination of trace copper and chromium in silicon nitride by fluorinating electrothermal vaporization inductively coupled plasma atomic emission spectrometry with the slurry sampling technique

✍ Scribed by Tianyou Peng; Zucheng Jiang; Bin Hu; Zhenghuan Liao

Publisher: Springer
Year: 1999
Tongue: English
Weight: 57 KB
Volume: 364
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s002160051384

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