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Direct comparison of photoluminescence lifetime and defect densities in ZnO epilayers studied by time-resolved photoluminescence and slow positron annihilation techniques

✍ Scribed by Koida, T. ;Uedono, A. ;Tsukazaki, A. ;Sota, T. ;Kawasaki, M. ;Chichibu, S. F.


Book ID
105362730
Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
228 KB
Volume
201
Category
Article
ISSN
0031-8965

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