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Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques

✍ Scribed by Schwank, James R.; Shaneyfelt, Marty R.; Dodd, Paul E.; McMorrow, Dale; Vizkelethy, Gyorgy; Ferlet-Cavrois, Véronique; Gouker, Pascale M.; Flores, Richard S.; Stevens, Jeffrey; Buchner, Stephen B.; Dalton, Scott M.; Swanson, Scot E.


Book ID
119950469
Publisher
IEEE
Year
2011
Tongue
English
Weight
553 KB
Volume
58
Category
Article
ISSN
0018-9499

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