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Direct and inverse problems of studying the properties of multilayer nanostructures based on a two-dimensional model of X-ray reflection and scattering

✍ Scribed by Khachaturov, R. V.


Book ID
125393992
Publisher
SP MAIK Nauka/Interperiodica
Year
2014
Tongue
English
Weight
580 KB
Volume
54
Category
Article
ISSN
0965-5425

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