✦ LIBER ✦
Digital signal measurements on passivated submicron ICs by scanning force microscope-testing
✍ Scribed by J. Sprengepiel; C. Böhm; E. Kubalek
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 379 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0167-9317
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