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Digital characteristics of a CMOS ternary inverter at the liquid nitrogen temperature

✍ Scribed by A. Srivastava

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
253 KB
Volume
33
Category
Article
ISSN
0026-2714

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πŸ“œ SIMILAR VOLUMES

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The performance of a CMOS three-valued logic device (ternary inverter) has been studied at liquid nitrogen temperature (77 K) in comparison with its room temperature (296 K) operation. It has been observed that performance improves at 77 K compared with room temperature behaviour. This improvement i

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We have designed, implemented and studied the performance at liquid nitrogen temperature (77 K) of a CMOS ternary full adder and its building blocks, the simple ternary inverter (STI), positive ternary inverter (PTI) and negative ternary inverter (NTI), and compared the corresponding performance at

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In order to supplement the VAMAS round robin test (RRT) on the bending strain dependence of critical current, I c , of Ag/Bi-2223 tapes conducted in 2001, a miniature bending RRT at 77 K and room temperature, RT, participated by three laboratories has been conducted. Three devices developed by Golda