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Diffusion-time-resolved ion-beam-induced charge collection from stripe-like test junctions induced by heavy-ion microbeams

✍ Scribed by B.N. Guo; M. El Bouanani; S.N. Renfrow; M. Nigam; D.S. Walsh; B.L. Doyle; J.L. Duggan; F.D. McDaniel


Book ID
114164794
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
450 KB
Volume
181
Category
Article
ISSN
0168-583X

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