✦ LIBER ✦
Diffusion of substitutional impurities in silicon at short oxidation times: An insight into point defect kinetics: D A Antoniadis and I Moskowitz, J Appl Phys, 53 (10), 1982, 6782-2796
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 148 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0042-207X
No coin nor oath required. For personal study only.