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Diffusion of Impurities in the Semiconductor Melt III. Experimental Determination of Thickness of the Solute Diffusion Layer in the Melting Process

โœ Scribed by Kodera, Hiroshi; Iida, Shinya; Tauchi, Shoji


Book ID
127244103
Publisher
Institute of Pure and Applied Physics
Year
1963
Tongue
English
Weight
834 KB
Volume
2
Category
Article
ISSN
0021-4922

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