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Diffusion of impurities from implanted silicon layers by rapid thermal annealing

✍ Scribed by Aleksandrov, O. V. ;Kozlovskii, V. V. ;Popov, V. V. ;Samorukov, B. E.


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
196 KB
Volume
110
Category
Article
ISSN
0031-8965

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