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Diffusion of 59Fe in γ-TiAl single crystals

✍ Scribed by N. Terashita; Y. Nose; T. Ikeda; H. Nakajima; H. Inui; M. Yamaguchi

Book ID
117357598
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
157 KB
Volume
57
Category
Article
ISSN
0167-577X

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Tracer diffusion of 44 Ti and 63 Ni in γ-TiAl has been investigated using single crystal samples by the ion-beam sputter-sectioning technique in the temperature range from 1133 to 1307 K and from 1053 to 1278 K, respectively. The tracer diffusion coefficients have been measured in the directions par