Diffusion length and surface recombination velocity measurements with the scanning electron microscope: the highly-doped emitter of a p-n junction: D. E. Burk and R. Sundaresan. Solid-St. Electron.27 (1), 59 (1984)

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 127 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90155-0