Diffusion-induced imperfections in silicon : M. L. Joshi and F. Wilhelm. Journal of the Electrochemical Society112, No. 2 (February 1965), p. 185

• Book ID: 113190437
• Publisher: Elsevier Science
• Year: 1966
• Tongue: English
• Weight: 106 KB
• Volume: 5
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(66)90196-x