✦ LIBER ✦
Diffuse x-ray scattering of misfit dislocations at Si1-xGex/Si interfaces by triple crystal diffractometry
✍ Scribed by Bhagavannarayana, G.; Zaumseil, P.
- Book ID
- 118039638
- Publisher
- American Institute of Physics
- Year
- 1997
- Tongue
- English
- Weight
- 380 KB
- Volume
- 82
- Category
- Article
- ISSN
- 0021-8979
- DOI
- 10.1063/1.365885
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