Diffraction of neutron standing waves in thin films with resonance enhancement

✍ Scribed by Huai Zhang; S.K. Satija; P.D. Gallagher; J.A. Dura; K. Ritley; C.P. Flynn; J.F. Ankner

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 375 KB
• Volume: 221
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/0921-4526(95)00966-3

✦ Synopsis

Diffraction of neutron standing waves in thin films has been demonstrated for the first time with experiments on an epitaxial Y/Gd/Y/Nb/'AI203 sample. Resonance enhancement in the diffraction intensity has been observed. The new diffraction scheme for neutrons and X-rays provides an oscillatory spatial concentration in thin films, in contrast to the evanescent diffraction which provides an exponential concentration. It also discriminates against diffraction background from substrate, and may be especially useful when diffraction in transmission geometry is not available due to high absorption of substrate.