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Diffraction limitations for plasma electron density measurements with schlieren methods

✍ Scribed by Dodel, G. ;Kunz, W.

Book ID
115324635
Publisher
The Optical Society
Year
1975
Tongue
English
Weight
572 KB
Volume
14
Category
Article
ISSN
1559-128X

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A Mach-Zehnder interferometer with pulsed nitrogen laser used for electronic density studies in the plasma focus device is described. The light pulse duration of 2 ns enables interferometric meaeurements to be made at any instant during the plasma evolution in n 20 kJ (20 kV) device. -4 numerical me