✦ LIBER ✦

Difficulties in the detection of surface impurities on platinum using Auger electron spectroscopy

✍ Scribed by M. Mundschau; R. Vanselow

Publisher: Elsevier Science
Year: 1985
Weight: 65 KB
Volume: 157
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(85)91079-5

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Auger electron spectroscopy study of the

Auger electron spectroscopy study of the sputtering effect on platinum silicide surfaces

✍ S. Valeri; U. del Pennino; P. Lomellini 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 680 KB

On the detection of elemental Li on AlL

On the detection of elemental Li on AlLi alloy surfaces using Auger electron spectroscopy

✍ D.J. Bottomley; G. Lüpke; J. Bloch; H.M. van Driel; R.S. Timsit 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 174 KB

The detection of impurities on metallic

The detection of impurities on metallic surfaces by means of the electron energy loss spectroscopy

✍ Prof. Dr. sc. nat. W. Heyroth 📂 Article 📅 1981 🏛 John Wiley and Sons 🌐 English ⚖ 344 KB 👁 1 views

Analysis of surface segregation in Co-Ru

Analysis of surface segregation in Co-Ru alloy using Auger electron spectroscopy

✍ P.J. Godowski 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 429 KB

Segregation Study of the phase on the Al

Segregation Study of the phase on the Al–Li Alloy Surface using Auger Electron Spectroscopy

✍ S. Belkhiat; F. Keraghel 📂 Article 📅 2009 🏛 Elsevier 🌐 English ⚖ 382 KB

Detection of surface impurities on Si wa

Detection of surface impurities on Si wafers using total reflection x-ray photoelectron spectroscopy

✍ Iijima, Yoshitoki; Miyoshi, Kousuke; Saito, Shuichi 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 400 KB 👁 2 views

Total reÑection x-ray photoelectron spectroscopy (TRXPS) has been applied to measure contamination elements on Si wafers using an x-ray photoelectron spectrometer. The radiated x-rays are limited by a slit placed in front of the Al anode, and the grazing angle is made shallow by using a crystal to m