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Differential thermal analysis (DTA) investigation of amorphous MoxNi1−x alloys

✍ Scribed by L. Dargel-Sulir

Book ID
116016410
Publisher
Elsevier Science
Year
1987
Weight
345 KB
Volume
128
Category
Article
ISSN
0022-5088

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X-Ray Diffraction (XRD), Differential Thermal Analysis (DTA), and Scanning Electron Microscopy (SEM) of (CuInSe2)1?x (VSe)x Alloys (0 ?x ? 0.5)
✍ Grima Gallardo, P. ;Dur�n, S. ;Quintero, M. ;Mu�oz, M. ;Delgado, G. ;Brice�o, J. 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 144 KB 👁 2 views

Polycrystalline samples of (CuInSe 2 ) 1--x (VSe) x alloys have been prepared by the usual melt and anneal technique in the composition range 0 x 0.5. X-ray diffraction (XRD), differential thermal analysis (DTA) and scanning electron microscopy techniques were used to characterize the products. By S