Differential fault analysis of ARIA in multi-byte fault models

[Lecture Notes in Computer Science] Smar

[Lecture Notes in Computer Science] Smart Card Research and Advanced Applications Volume 7079 || Differential Fault Analysis of AES-128 Key Schedule Using a Single Multi-byte Fault

✍ Prouff, Emmanuel 📂 Article 📅 2011 🏛 Springer Berlin Heidelberg ⚖ 379 KB

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[Information Security and Cryptography] Fault Analysis in Cryptography || Differential Fault Analysis of DES

✍ Joye, Marc; Tunstall, Michael 📂 Article 📅 2012 🏛 Springer Berlin Heidelberg 🌐 German ⚖ 597 KB

In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industr

Multi-fault diagnosis of rolling bearing

Multi-fault diagnosis of rolling bearing elements using wavelet analysis and hidden Markov model based fault recognition

✍ V. Purushotham; S. Narayanan; Suryanarayana A.N. Prasad 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 497 KB

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[Information Security and Cryptography] Fault Analysis in Cryptography || Differential Fault Analysis of the Advanced Encryption Standard

✍ Joye, Marc; Tunstall, Michael 📂 Article 📅 2012 🏛 Springer Berlin Heidelberg 🌐 German ⚖ 514 KB

In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industr

[Information Security and Cryptography]

[Information Security and Cryptography] Fault Analysis in Cryptography Volume 715 || A Survey of Differential Fault Analysis Against Classical RSA Implementations

✍ Joye, Marc; Tunstall, Michael 📂 Article 📅 2012 🏛 Springer Berlin Heidelberg 🌐 German ⚖ 174 KB

In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industr

Fault diagnosis in power transformers us

Fault diagnosis in power transformers using multi-class logical analysis of data

✍ Mortada, Mohamad-Ali; Yacout, Soumaya; Lakis, Aouni 📂 Article 📅 2013 🏛 Springer US 🌐 English ⚖ 393 KB