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Differential effects on verbal-performance achievement levels on the WAIS-R as a function of progressive error rate on the Memory for Designs Test (MFD)

✍ Scribed by Evans Mandes; Theodore Gessner


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
258 KB
Volume
44
Category
Article
ISSN
0021-9762

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✦ Synopsis


One hundred seventy-eight subjects participated in a study to measure the degree of selective subtest decline on the WAIS-R as a function of increased error rate on the Memory-for-Designs Test. The data show that there is an initial, significant decline in the verbal knowledge component of the verbal scale as error rate on the MFD progresses. Performance factors are only significantly related to error rate on the MFD when the latter are maximized.