Differential charging in XPS. Part III. A comparison of charging in thin polymer overlayers on conducting and non-conducting substrates

✍ Scribed by Tielsch, Brian J.; Fulghum, Julia E.

• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 752 KB
• Volume: 25
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/(sici)1096-9918(199710)25:11<904::aid-sia316>3.0.co;2-d

✦ Synopsis

Previous work has used small-area and imaging XPS to show that di †erential charging in bulk insulators develops as a result of non-uniform x-ray Ñux across the surface, causing lateral di †erential charging. Charging in heterogeneous samples can be further a †ected by the local sample environment and sample mounting. The current work extends these studies through an analysis of di †erential charging e †ects in thin overlayers on conducting and insulating substrates. The charging observed in PnBMA overlayers on indium tin oxide, glass, Ag and Al is discussed as a function of substrate conductivity and photoelectron cross-sections. Substrate conductivity is the most signiÐcant factor in determining the magnitude of the overlayer charging observed when no charge compensation is utilized. Di †erential charging in the PnBMA overlayer was used to image a patterned substrate containing insulating and conducting areas.