✦ LIBER ✦
Differential capacitance measurements of relaxation-induced defects in InGaAs/GaAs Schottky diodes
✍ Scribed by Jenn-Fang Chen; Nie-Chuan Chen; Jiin-Shung Wang; Chen, Y.F.
- Book ID
- 114538554
- Publisher
- IEEE
- Year
- 2001
- Tongue
- English
- Weight
- 129 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0018-9383
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