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Differential-aperture X-ray structural microscopy: a submicron-resolution three-dimensional probe of local microstructure and strain

✍ Scribed by Wenge Yang; B.C Larson; J.Z Tischler; G.E Ice; J.D Budai; W Liu


Book ID
108210279
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
439 KB
Volume
35
Category
Article
ISSN
0968-4328

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