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Differential anomalous X-ray scattering studies of amorphous In–Se

✍ Scribed by A. Jablonska; A. Burian; T.H. Metzger; D. LeBolloc’h; M. Hamilton; D. Raoux

Book ID
116599156
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
109 KB
Volume
401
Category
Article
ISSN
0925-8388

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## Abstract Anomalous X‐ray scattering experiments on glassy Ge~__x__~Se~1−__x__~ semiconductors have been carried out at energies close to the Ge and Se K edges in a wide concentration range from __x__ = 0.15 to 0.333 across the rigidity percolation threshold composition of __x__ = 0.20. The total