Difference of soft error rates in SOI SRAM induced by various high energy ion species

✍ Scribed by Satoshi Abo; Naoyuki Masuda; Fujio Wakaya; Tivadar Lohner; Shinobu Onoda; Takahiro Makino; Toshio Hirao; Takeshi Ohshima; Toshiaki Iwamatsu; Hidekazu Oda; Mikio Takai

• Book ID: 113823609
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 330 KB
• Volume: 273
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2011.07.090