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Dielectric theory of localised valence energy loss spectroscopy

โœ Scribed by M.G. Walls; A. Howie


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
201 KB
Volume
28
Category
Article
ISSN
0304-3991

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โœ M.C. Cheynet; R. Pantel ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 466 KB

Valence and Core Electron Energy Loss Spectroscopy (VEELS and CEELS) experiments are performed from nanocrystallized nickel silicide thin films. Three different silicide compounds are identified in the films. Their chemical compositions are determined from Ni-L(2,3) to Si-K core edges quantification