๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Dielectric-Parameter Measurements of SiC at Millimeter and Submillimeter Wavelengths

โœ Scribed by Shu Chen; Afsar, M.N.; Sakdatorn, D.


Book ID
114630838
Publisher
IEEE
Year
2008
Tongue
English
Weight
626 KB
Volume
57
Category
Article
ISSN
0018-9456

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES