Dielectric Function of Polycrystalline SiC from 190 nm to 15 μm

✍ Scribed by S. Zollner; Ran Liu; A. Konkar; J. Gutt; S. R. Wilson; T. I. Tiwald; J. A. Woollam; J. N. Hilfiker

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 179 KB
• Volume: 215
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/(sici)1521-3951(199909)215:1<21::aid-pssb21>3.0.co;2-o