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Dielectric breakdown strength correlation with time-to-failure during wet aging of XLPE-insulated cables

✍ Scribed by Walton, M.D.; Bernstein, B.S.; Thue, W.A.; Smith, J.T.

Book ID: 121676975
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 696 KB
Volume: 14
Category: Article
ISSN: 0885-8977
DOI: 10.1109/61.772310

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