✦ LIBER ✦
Dielectric breakdown strength affected by the lamellar configuration in XLPE insulation at a semiconducting interface
✍ Scribed by Okamoto, T.; Ishida, M.; Hozumi, N.
- Book ID
- 114533252
- Publisher
- IEEE
- Year
- 1989
- Tongue
- English
- Weight
- 743 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0018-9367
- DOI
- 10.1109/14.34194
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